LIBS, XRF, & Ultrasonic Thickness Analysis

X-ray fluorescence (XRF) analysis is a nondestructive testing (NDT) method used to determine the elemental composition of materials. Our handheld XRF analyzer can accurately measure the percent composition of a wide range of elements—such as Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Zr, Nb, Mo, Ag, Sn, Sb, W, Au, Pb, Bi, Mg, Al, Si, P, and S—making it ideal for positive material identification (PMI), alloy verification, and confirming key elements (for example, chromium and nickel content in stainless steel).

For applications where carbon content is critical—especially in carbon steels and certain stainless steels—we also provide handheld LIBS (Laser-Induced Breakdown Spectroscopy) analysis. Using an argon-assisted LIBS analyzer, we can measure carbon directly in the field, helping verify steel grades more confidently than XRF alone in carbon-sensitive cases. This is particularly valuable in reverse engineering and QA/QC workflows where matching the original material specification is essential.

Because 3D laser scanners measure only the surface geometry of an object, there are cases where thickness cannot be determined from scan data alone. To close that gap, we also perform ultrasonic thickness gauge measurements (NDT) to capture true wall thickness and remaining thickness. When combined with 3D laser scan data—and supported by material verification from XRF/LIBS—these measurements enable accurate, comprehensive deliverables such as as-built 2D & 3D CAD models, BIM models, and plant design models, aligned to both geometry and real-world engineering constraints.